4306 search results - page 145 / 862 » Timed Testing with TorX |
ICSM
2009
IEEE
14 years 5 months ago
2009
IEEE
Since manual black-box testing of GUI-based APplications (GAPs) is tedious and laborious, test engineers create test scripts to automate the testing process. These test scripts in...
STACS
2007
Springer
14 years 4 months ago
2007
Springer
A coloring of a graph is convex if it induces a partition of the vertices into connected subgraphs. Besides being an interesting property from a theoretical point of view, tests f...
ET
2002
13 years 10 months ago
2002
The paper presents a method for testing a system-on-achip by using a compressed representation of the patterns on an external tester. The patterns for a certain core under test ar...
CORR
2009
Springer
13 years 8 months ago
2009
Springer
Abstract. We apply Uppaal Tiga to automatically compute adaptive scheduling strategies for an industrial case study dealing with a state-of-the-art image processing pipeline of a p...
VLSID
2002
IEEE
14 years 10 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...