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IJCSA
2007
13 years 7 months ago
2007
Timed Concurrent State Machines are an application of Alur’s Timed Automata concept to coincidence-based (rather than interleaving) CSM modeling technique. TCSM support the idea...
FEDCSIS
2011
12 years 7 months ago
2011
Abstract—The Future Internet will be a complex interconnection of services, applications, content and media, on which our society will become increasingly dependent. Time to mark...
ERSHOV
2006
Springer
13 years 11 months ago
2006
Springer
Abstract. TTCN-3 is a standardized language for specifying and executing test suites that is particularly popular for testing embedded systems. Prior to testing embedded software i...
TCAD
2008
13 years 7 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...