4306 search results - page 150 / 862 » Timed Testing with TorX |
CVPR
2005
IEEE
15 years 10 days ago
2005
IEEE
: In many computer vision classification problems, both the error and time characterizes the quality of a decision. We show that such problems can be formalized in the framework of...
SENSYS
2009
ACM
14 years 5 months ago
2009
ACM
Continuous and reliable operation of WSNs is notoriously difficult to guarantee due to hardware degradation and environmental changes. In this paper, we propose and demonstrate a ...
MTDT
2003
IEEE
14 years 3 months ago
2003
IEEE
: Linked faults are very important for memory testing because they reduce the fault coverage of the tests. Their analysis has proven to be a source for new memory tests, characteri...
DAC
2003
ACM
14 years 11 months ago
2003
ACM
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
ISSRE
2006
IEEE
14 years 4 months ago
2006
IEEE
Aspect-oriented software development is gaining popularity with the adoption of languages such as AspectJ. Testing is an important part in any software development, including aspe...