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DATE
2007
IEEE
109views Hardware» more  DATE 2007»
14 years 4 months ago
Toward a scalable test methodology for 2D-mesh Network-on-Chips
1 This paper presents a BIST strategy for testing the NoC interconnect network, and investigates if the strategy is a suitable approach for the task. All switches and links in the ...
Kim Petersén, Johnny Öberg
FOCS
2002
IEEE
14 years 3 months ago
A Lower Bound for Testing 3-Colorability in Bounded-Degree Graphs
We consider the problem of testing 3-colorability in the bounded-degree model. We show that, for small enough ε, every tester for 3colorability must have query complexity Ω(n)....
Andrej Bogdanov, Kenji Obata, Luca Trevisan
SAC
2009
ACM
14 years 5 months ago
An empirical study of incorporating cost into test suite reduction and prioritization
Software developers use testing to gain and maintain confidence in the correctness of a software system. Automated reduction and prioritization techniques attempt to decrease the...
Adam M. Smith, Gregory M. Kapfhammer
EMSOFT
2005
Springer
14 years 3 months ago
Testing real-time embedded software using UPPAAL-TRON: an industrial case study
UPPAAL-TRON is a new tool for model based online black-box conformance testing of real-time embedded systems specified as timed automata. In this paper we present our experiences...
Kim Guldstrand Larsen, Marius Mikucionis, Brian Ni...
CLEF
2001
Springer
14 years 2 months ago
Minimalistic Test Runs of the Eidetica Indexer
Participating in a text retrieval conference for the first time, Eidetica has run six minimalistic tests with its t·repository indexer, doing as little tuning as possible, in ord...
Teresita Frizzarin, Annius Groenink