4306 search results - page 167 / 862 » Timed Testing with TorX |
ICALP
2001
Springer
14 years 2 months ago
2001
Springer
In this paper we initiate the study of testing properties of hypergraphs. The goal of property testing is to distinguish between the case whether a given object has a certain prope...
DATE
1999
IEEE
14 years 2 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
SIGUCCS
1999
ACM
14 years 2 months ago
1999
ACM
The University of Portland Office of Computer and Telecommunication Services (CTS) created an Intranet web site for the University community during the summer of 1998. In the summ...
INLG
2010
Springer
13 years 8 months ago
2010
Springer
Critical software most often requires an independent validation and verification (IVV). IVV is usually performed by domain experts, who are not familiar with specific, many times ...
ICCD
2003
IEEE
14 years 7 months ago
2003
IEEE
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...