4306 search results - page 168 / 862 » Timed Testing with TorX |
ETS
2006
IEEE
14 years 4 months ago
2006
IEEE
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
DATE
2003
IEEE
14 years 3 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
KBSE
2003
IEEE
14 years 3 months ago
2003
IEEE
The use of techniques for automating the generation of software test cases is very important as it can reduce the time and cost of this process. The latest methods for automatic g...
TOOLS
2010
IEEE
14 years 3 months ago
2010
IEEE
JSContest is a tool that enhances JavaScript with simple, type-like contracts and provides a framework for monitoring and guided random testing of programs against these contracts ...
MTDT
2000
IEEE
14 years 2 months ago
2000
IEEE
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...