4306 search results - page 184 / 862 » Timed Testing with TorX |
DATE
2008
IEEE
14 years 5 months ago
2008
IEEE
Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing...
VTS
2007
IEEE
14 years 4 months ago
2007
IEEE
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
XPU
2007
Springer
14 years 4 months ago
2007
Springer
Testing is an essential part of an agile process as test is automated and tends to take the role of specifications in place of documents. However, whenever test cases are faulty, d...
VLSID
2005
IEEE
14 years 4 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
CSMR
2003
IEEE
14 years 4 months ago
2003
IEEE
Testing a distributed system is difficult. Good testing depends on both skill and understanding the system under test. We have developed a method to observe the system at the CORB...