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CSSC
2010
123views more  CSSC 2010»
13 years 7 months ago
Testing Fractional Order of Long Memory Processes: A Monte Carlo Study
Testing the fractionally integrated order of seasonal and non-seasonal unit roots is quite important for the economic and financial time series modelling. In this paper, Robinson ...
Laurent Ferrara, Dominique Guegan, Zhiping Lu
DAGSTUHL
2007
13 years 9 months ago
Diagonal Circuit Identity Testing and Lower Bounds
In this paper we give the first deterministic polynomial time algorithm for testing whether a diagonal depth-3 circuit C(x1, . . . , xn) (i.e. C is a sum of powers of linear funct...
Nitin Saxena
TCAD
2010
102views more  TCAD 2010»
13 years 2 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
DDECS
2009
IEEE
149views Hardware» more  DDECS 2009»
13 years 11 months ago
Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing
Although the Neighborhood Pattern Sensitive Fault (NPSF) model is recognized as a high quality fault model for memory arrays, the excessive test application time cost associated wi...
Yiorgos Sfikas, Yiorgos Tsiatouhas
BMCBI
2007
197views more  BMCBI 2007»
13 years 7 months ago
Boolean networks using the chi-square test for inferring large-scale gene regulatory networks
Background: Boolean network (BN) modeling is a commonly used method for constructing gene regulatory networks from time series microarray data. However, its major drawback is that...
Haseong Kim, Jae K. Lee, Taesung Park