4306 search results - page 31 / 862 » Timed Testing with TorX |
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
COCO
2006
Springer
13 years 9 months ago
2006
Springer
We study the identity testing problem for depth 3 arithmetic circuits ( circuit). We give the first deterministic polynomial time identity test for circuits with bounded top fanin...
CSDA
2007
13 years 7 months ago
2007
A time series is said to Granger cause another series if it has incremental predictive power when forecasting it. While Granger causality tests have been studied extensively in th...
SODA
2003
ACM
13 years 9 months ago
2003
ACM
In this paper we present a simple deterministic algorithm for testing whether a multivariate polynomial f(x1, . . . , xn) is identically zero, in time polynomial in m, n, log(d + ...
DATE
2002
IEEE
14 years 15 days ago
2002
IEEE
We present a new test resource partitioning (TRP) technique for reduced pin-count testing of system-on-a-chip (SOC). The proposed technique is based on test data compression and o...