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ITC
1992
IEEE
76views Hardware» more  ITC 1992»
13 years 11 months ago
A Small Test Generator for Large Designs
In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. t...
Sandip Kundu, Leendert M. Huisman, Indira Nair, Vi...
CEAS
2008
Springer
13 years 9 months ago
Global-scale Anti-spam Testing in Your Own Back Yard
The effectiveness of anti-spam techniques is an important question: after all, spam has a real cost to legitimate users in terms of time and resources. The problem is how we deter...
Margaret Nielsen, Dane Bertram, Sampson Pun, John ...
MASCOTS
1998
13 years 9 months ago
Simulation-based 'STRESS' Testing Case Study: A Multicast Routing Protocol
In this work, we propose a method for using simulation to analyze the robustness of multiparty (multicastbased) protocols in a systematic fashion. We call our method Systematic Te...
Ahmed Helmy, Deborah Estrin
CATA
2009
13 years 8 months ago
Built-in Self-Test for Memory Resources in Virtex-4 Field Programmable Gate Arrays
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the...
Brooks R. Garrison, Daniel T. Milton, Charles E. S...
ETS
2011
IEEE
230views Hardware» more  ETS 2011»
12 years 7 months ago
Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis
—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...
Nuno Alves, Y. Shi, N. Imbriglia, Jennifer Dworak,...