As technology scales down, timing verification of digital integrated circuits becomes an increasingly challenging task due to the gate and wire variability. Therefore, statistical...
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
of a direct implementation of this criterion. This paper presents the first critical path finding tool based on the exact criterion. It offers therefore better results in compariso...
This paper presents an efficient hierarchical 3D capacitance extraction algorithm -- ICCAP. Most previous capacitance extraction algorithms introduce intermediate variables to fac...
Binary decision diagrams (BDDs) have been shown to be a powerful tool in formal verification. Efficient BDD construction techniques become more important as the complexity of proto...
Bwolen Yang, Yirng-An Chen, Randal E. Bryant, Davi...