718 search results - page 59 / 144 » Timing Yield Calculation Using an Impulse-Train Approach |
GECCO
2009
Springer
14 years 2 months ago
2009
Springer
This work provides an analysis of using the evolutionary algorithm EPNet to create ensembles of artificial neural networks to solve a range of forecasting tasks. Several previous...
DATE
2010
IEEE
14 years 24 days ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
ENTCS
2007
13 years 7 months ago
2007
Performance prediction methods for component-based software systems aim at supporting design decisions of software architects during early development stages. With the increased a...
FOCM
2010
13 years 6 months ago
2010
Abstract. An automated method of general purpose is introduced for computing a rigorous estimate of a bounded region in Rn whose points satisfy a given property. The method is base...
ET
2002
13 years 7 months ago
2002
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...