37 search results - page 4 / 8 » Timing analysis in presence of supply voltage and temperatur... |
ITC
1999
IEEE
13 years 11 months ago
1999
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...
IOLTS
2006
IEEE
14 years 22 days ago
2006
IEEE
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
MICRO
2009
IEEE
14 years 1 months ago
2009
IEEE
With continued advances in CMOS technology, parameter variations are emerging as a major design challenge. Irregularities during the fabrication of a microprocessor and variations...
ASPDAC
2011
ACM
12 years 10 months ago
2011
ACM
- In low temperature polycrystalline silicon (LTPS) based display technologies, the electrical parameter variations in thin film transistors (TFTs) caused by random grain boundarie...
DAC
2000
ACM
14 years 7 months ago
2000
ACM
This paper presents a novel run-time dynamic voltage scaling scheme for low-power real-time systems. It employs software feedback control of supply voltage, which is applicable to...