264 search results - page 9 / 53 » Timing driven power gating |
ICCD
2004
IEEE
14 years 5 months ago
2004
IEEE
Leakage current is a key factor in IC power consumption even in the active operating mode. We investigate the simultaneous optimization of gate size and threshold voltage to reduc...
ATS
2005
IEEE
14 years 2 months ago
2005
IEEE
— Structural transformation of a design to enhance its testability while satisfying design constraints on power and performance, can result in improved test cost and test confid...
ICCD
2008
IEEE
14 years 5 months ago
2008
IEEE
— Run-time Active Leakage Reduction (RALR) is a recent technique and aims at aggressively reducing leakage power consumption. This paper studies the feasibility of RALR from the ...
ICCAD
2004
IEEE
14 years 5 months ago
2004
IEEE
Abstract— This paper presents a post-route, timingconstrained gate-sizing algorithm for crosstalk reduction. Gate-sizing has emerged as a practical and feasible method to reduce ...
TVLSI
2008
13 years 8 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...