188 search results - page 19 / 38 » Timing-driven optimization using lookahead logic circuits |
DAC
2007
ACM
14 years 11 months ago
2007
ACM
This paper presents a variation resilient circuit design technique for maintaining parametric yield of design under inherent variation in process parameters. We propose to utilize...
ISQED
2011
IEEE
13 years 1 months ago
2011
IEEE
Due to the dramatic increase in design complexity, verifying the functional correctness of a circuit is becoming more difficult. Therefore, bugs may escape all verification effo...
ASPDAC
2010
ACM
13 years 8 months ago
2010
ACM
Abstract-- Optimizing blocks in a System-on-Chip (SoC) circuit is becoming more and more important nowadays due to the use of third-party Intellectual Properties (IPs) and reused d...
MICRO
2006
IEEE
13 years 10 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
DAC
2005
ACM
14 years 11 months ago
2005
ACM
: Due to exponential increase in subthreshold leakage with technology scaling and temperature increase, leakage power is becoming a major fraction of total power in the active mode...