55 search results - page 7 / 11 » Tolerating Radiation-Induced Transient Faults in Modern Proc... |
HPCA
2007
IEEE
14 years 7 months ago
2007
IEEE
It is widely accepted that transient failures will appear more frequently in chips designed in the near future due to several factors such as the increased integration scale. On t...
ET
2008
13 years 7 months ago
2008
Processor cores embedded in systems-on-a-chip (SoCs) are often deployed in critical computations, and when affected by faults they may produce dramatic effects. When hardware harde...
TPDS
2008
13 years 7 months ago
2008
It is widely accepted that transient failures will appear more frequently in chips designed in the near future due to several factors such as the increased integration scale. On th...
FTCS
1996
13 years 8 months ago
1996
In the research reported in this paper, transient faults were injected in the nodes and in the communication subsystem (by using software fault injection) of a commercial parallel...
DSN
2006
IEEE
14 years 1 months ago
2006
IEEE
As chip densities and clock rates increase, processors are becoming more susceptible to transient faults that can affect program correctness. Computer architects have typically ad...