75 search results - page 11 / 15 » Tolerating hardware device failures in software |
TC
2011
13 years 4 months ago
2011
—Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Since a large fraction of chip area is devoted to on-...
MOBISYS
2008
ACM
14 years 9 months ago
2008
ACM
Many people desire ubiquitous access to their personal computing environments. We present a system in which a user leverages a personal mobile device to establish trust in a publi...
MICRO
2008
IEEE
14 years 4 months ago
2008
IEEE
Scaling of CMOS feature size has long been a source of dramatic performance gains. However, the reduction in voltage levels has not been able to match this rate of scaling, leadin...
ASPLOS
2006
ACM
14 years 3 months ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
CASES
2008
ACM
13 years 11 months ago
2008
ACM
While technology advances have made MPSoCs a standard architecture for embedded systems, their applicability is increasingly being challenged by dramatic increases in the amount o...