184 search results - page 28 / 37 » Towards Statistical Control of an Industrial Test Process |
3DIM
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper describes how to automatically extract the presence and location of geometrical irregularities on a surface of revolution. To this end a partial 3D scan of the workpiec...
ISQED
2010
IEEE
14 years 2 months ago
2010
IEEE
—Double patterning lithography (DPL) provides an attractive alternative or a supplementary method to enable the 32nm and 22nm process nodes, relative to costlier technology optio...
BMCBI
2005
13 years 7 months ago
2005
Background: The evaluation of statistical significance has become a critical process in identifying differentially expressed genes in microarray studies. Classical p-value adjustm...
AIPS
2006
13 years 9 months ago
2006
Supply chains are ubiquitous in the manufacturing of many complex products. Traditionally, supply chains have been created through the intricate interactions of human representati...
BMCBI
2006
2006
A minimally invasive multiple marker approach allows highly efficient detection of meningioma tumors
13 years 7 months ago
Background: The development of effective frameworks that permit an accurate diagnosis of tumors, especially in their early stages, remains a grand challenge in the field of bioinf...