— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
In this paper we describe how Network-on-Chip (NoC) will be the next major challenge to implementing complex and function-rich applications in advanced manufacturing processes at ...
Many commercially available embedded processors are capable of extending their base instruction set for a specific domain of applications. While steady progress has been made in t...
In this note we introduce a new methodology that combines tools from social language processing and network analysis to identify socially situated relationships between individual...
Andrew J. Scholand, Yla R. Tausczik, James W. Penn...
Aspect-Oriented Modeling (AOM) provides support for separating concerns at the design level. Even though most AOM approaches provide means to execute the composition of the modula...
Aram Hovsepyan, Riccardo Scandariato, Stefan Van B...