282 search results - page 48 / 57 » Transient Fault Detectors |
WDAG
2007
Springer
14 years 1 months ago
2007
Springer
Consider a distributed network of n nodes that is connected to a global source of “beats”. All nodes receive the “beats” simultaneously, and operate in lock-step. A scheme ...
PDP
2011
IEEE
12 years 11 months ago
2011
IEEE
Abstract—Continuously reducing transistor sizes and aggressive low power operating modes employed by modern architectures tend to increase transient error rates. Concurrently, mu...
VLSID
2004
IEEE
14 years 7 months ago
2004
IEEE
As we move from deep submicron technology to nanotechnology for device manufacture, the need for defect-tolerant architectures is gaining importance. This is because, at the nanos...
VLSID
2002
IEEE
14 years 7 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
With the continued scaling of CMOS technologies and reduced design margins, the reliability concerns induced by transient faults have become prominent. Moreover, the popular energ...