12 search results - page 3 / 3 » Transient Models of Bus-Based Multiprocessors |
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
—As device feature size continues to shrink, reliability becomes a severe issue due to process variation, particle-induced transient errors, and transistor wear-out/stress such a...
HPCA
2006
IEEE
14 years 7 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...