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DAC
2005
ACM
16 years 5 months ago
StressTest: an automatic approach to test generation via activity monitors
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
DAC
2006
ACM
16 years 5 months ago
Stochastic variational analysis of large power grids considering intra-die correlations
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...
Praveen Ghanta, Sarma B. K. Vrudhula, Sarvesh Bhar...
MICCAI
2002
Springer
16 years 5 months ago
Line Integral Convolution for Visualization of Fiber Tract Maps from DTI
Abstract. Diffusion tensor imaging (DTI) can provide the fundamental information required for viewing structural connectivity. However, robust and accurate acquisition and processi...
Tim McGraw, Baba C. Vemuri, Zhizhou Wang, Yunmei C...
ICML
2009
IEEE
16 years 5 months ago
Large-scale deep unsupervised learning using graphics processors
The promise of unsupervised learning methods lies in their potential to use vast amounts of unlabeled data to learn complex, highly nonlinear models with millions of free paramete...
Rajat Raina, Anand Madhavan, Andrew Y. Ng
ICML
2008
IEEE
16 years 5 months ago
Listwise approach to learning to rank: theory and algorithm
This paper aims to conduct a study on the listwise approach to learning to rank. The listwise approach learns a ranking function by taking individual lists as instances and minimi...
Fen Xia, Tie-Yan Liu, Jue Wang, Wensheng Zhang, Ha...
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