4116 search results - page 116 / 824 » Type Analysis for CHIP |
ISQED
2011
IEEE
13 years 17 days ago
2011
IEEE
As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...
DAC
2005
ACM
13 years 10 months ago
2005
ACM
Variability of process parameters makes prediction of digital circuit timing characteristics an important and challenging problem in modern chip design. Recently, statistical stat...
ICMCS
2006
IEEE
14 years 2 months ago
2006
IEEE
With increased concern for physical security, video surveillance is becoming an important business area. Similar camera-based system can also be used in such diverse applications ...
TCAD
2008
13 years 8 months ago
2008
Manufacturing process variations lead to variability in circuit delay and, if not accounted for, can cause excessive timing yield loss. The familiar traditional approaches to timin...
DAC
2006
ACM
14 years 9 months ago
2006
ACM
The increasing use of Multiprocessor Systems-on-Chip (MPSoCs) for high performance demands of embedded applications results in high power dissipation. The memory subsystem is a la...