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RECOMB
2002
Springer
14 years 9 months ago
A bayesian approach to transcript estimation from gene array data: the BEAM technique
We present a new statistically optimal approach to estimate transcript levels and ratios from one or more gene array experiments. The Bayesian Estimation of Array Measurements (BE...
Ron O. Dror, Jonathan G. Murnick, Nicola A. Rinald...
DFT
2009
IEEE
189views VLSI» more  DFT 2009»
14 years 3 months ago
Analyzing Formal Verification and Testing Efforts of Different Fault Tolerance Mechanisms
Pre-fabrication design verification and post-fabrication chip testing are two important stages in the product realization process. These two stages consume a large part of resourc...
Meng Zhang, Anita Lungu, Daniel J. Sorin
DDECS
2007
IEEE
93views Hardware» more  DDECS 2007»
14 years 3 months ago
Manifestation of Precharge Faults in High Speed DRAM Devices
Abstract: High speed DRAMs today suffer from an increased sensitivity to interference and noise problems. Signal integrity issues, caused by bit line and word line coupling, result...
Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev
IPPS
2007
IEEE
14 years 3 months ago
Pipelining Tradeoffs of Massively Parallel SuperCISC Hardware Functions
Parallel processing using multiple processors is a well-established technique to accelerate many different classes of applications. However, as the density of chips increases, ano...
Colin J. Ihrig, Justin Stander, Alex K. Jones
ADAEUROPE
2005
Springer
14 years 2 months ago
Non-intrusive System Level Fault-Tolerance
This paper describes the methodology used to add nonintrusive system-level fault tolerance to an electronic throttle controller. The original model of the throttle controller is a...
Kristina Lundqvist, Jayakanth Srinivasan, Sé...