We present a new statistically optimal approach to estimate transcript levels and ratios from one or more gene array experiments. The Bayesian Estimation of Array Measurements (BE...
Ron O. Dror, Jonathan G. Murnick, Nicola A. Rinald...
Pre-fabrication design verification and post-fabrication chip testing are two important stages in the product realization process. These two stages consume a large part of resourc...
Abstract: High speed DRAMs today suffer from an increased sensitivity to interference and noise problems. Signal integrity issues, caused by bit line and word line coupling, result...
Parallel processing using multiple processors is a well-established technique to accelerate many different classes of applications. However, as the density of chips increases, ano...
This paper describes the methodology used to add nonintrusive system-level fault tolerance to an electronic throttle controller. The original model of the throttle controller is a...