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DELTA
2002
IEEE
14 years 1 months ago
Address and Data Scrambling: Causes and Impact on Memory Tests
: The way address sequences and data patterns appear on the outside of a memory may differ from their internal appearance; this effect is referred to as scrambling, which has a lar...
A. J. van de Goor, Ivo Schanstra
ICCAD
1996
IEEE
94views Hardware» more  ICCAD 1996»
14 years 1 months ago
Metrology for analog module testing using analog testability bus
In this paper, we propose a method to generate high quality test waveform on chip to avoid the parasitic eects in an analog testability bus test environment. For the test response...
Chauchin Su, Yue-Tsang Chen, Shyh-Jye Jou, Yuan-Tz...
NIPS
2001
13 years 10 months ago
Learning Spike-Based Correlations and Conditional Probabilities in Silicon
We have designed and fabricated a VLSI synapse that can learn a conditional probability or correlation between spike-based inputs and feedback signals. The synapse is low power, c...
Aaron P. Shon, David Hsu, Chris Diorio
TCAD
2008
114views more  TCAD 2008»
13 years 9 months ago
RUMBLE: An Incremental Timing-Driven Physical-Synthesis Optimization Algorithm
Physical synthesis tools are responsible for achieving timing closure. Starting with 130nm designs, multiple cycles are required to cross the chip, making latch placement critical...
David A. Papa, Tao Luo, Michael D. Moffitt, Chin-N...
MICCAI
2004
Springer
14 years 10 months ago
An Analysis Tool for Quantification of Diffusion Tensor MRI Data
A software tool for analyzing Diffusion Tensor MRI (DT-MRI) data is presented. The tool includes methods for segmentation of white matter for automatic definition of seed points fo...
Hae-Jeong Park, Martha Elizabeth Shenton, Carl-Fre...