872 search results - page 90 / 175 » UML-based design test generation |
116
Voted
DATE
2007
IEEE
15 years 10 months ago
2007
IEEE
- The intrinsic capability brought by each new technology node opens the way to a broad range of system integration options and continuously enables new applications to be integrat...
155
click to vote
FPGA
2005
ACM
15 years 9 months ago
2005
ACM
Creating a new FPGA is a challenging undertaking because of the significant effort that must be spent on circuit design, layout and verification. It currently takes approximately ...
124
click to vote
TCAD
2002
15 years 3 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
110
Voted
JOCN
2010
15 years 2 months ago
2010
■ Free recall is a fundamental paradigm for studying memory retrieval in the context of minimal cue support. Accordingly, free recall has been extensively studied using behavior...
128
Voted
CHI
2005
ACM
16 years 4 months ago
2005
ACM
Rapid growth in the scientific literature makes it increasingly difficult for scientists to keep abreast of findings outside their own narrowing fields of expertise. To help biome...