This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
Sukanta Das, Niloy Ganguly, Biplab K. Sikdar, Pari...
This paper presents a system for recognizing sketched logic circuits in real-time and graphically simulating them afterwords. It has been developed for use in university and school...
We consider the problem of bounded-error quantum state identification: given either state 0 or state 1, we are required to output `0', `1' or `?' ("don't ...
Dmitry Gavinsky, Julia Kempe, Oded Regev, Ronald d...
This paper describes a course in hardware description and synthesis (hardware compilation), taught as an introductory graduate course at Chalmers University of Technology, and as a...
Error correction procedures are considered which are designed specifically for the amplitude damping channel. Amplitude damping errors are analyzed in the stabilizer formalism. Thi...