Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional ...
Ilia Polian, Thomas Fiehn, Bernd Becker, John P. H...
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
Sukanta Das, Niloy Ganguly, Biplab K. Sikdar, Pari...
In this paper, a new approach to analog test design based on the circuit design process, called Characteristic Observation Inference (COI), is presented. In many situations, it is...
Walter M. Lindermeir, Helmut E. Graeb, Kurt Antrei...
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
Abstract— Substantial attention is being paid to the fault diagnosis problem in recent test literature. Yet, the compaction of test vectors for fault diagnosis is little explored...
Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahas...