18 search results - page 3 / 4 » Universal Test Sets for Reversible Circuits |
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the...
ET
2010
13 years 5 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
TE
2010
13 years 3 months ago
2010
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test educat...
DSD
2005
IEEE
14 years 2 months ago
2005
IEEE
We describe a new e-learning environment and a runtime platform for educational tools on digital system testing and design for testability. This environment is being developed in ...
JUCS
2007
13 years 8 months ago
2007
: This paper describes a method of using Petri net P-invariants in system diagnosis. To model this process a net oriented fault classification is presented. Hence, the considered d...