The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the...
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
Jacob D. Biamonte, Jeff S. Allen, Marek A. Perkows...
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test educat...
John Hu, Mark Haffner, Samantha Yoder, Mark Scott,...
We describe a new e-learning environment and a runtime platform for educational tools on digital system testing and design for testability. This environment is being developed in ...
Artur Jutman, Jaan Raik, Raimund Ubar, V. Vislogub...
: This paper describes a method of using Petri net P-invariants in system diagnosis. To model this process a net oriented fault classification is presented. Hence, the considered d...