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ICPR
2002
IEEE
14 years 10 months ago
Integrated Event Recognition from Multiple Sources
This paper proposes a system architecture for event recognition that integrates information from multiple sources (e.g., gesture and speech recognition from distributed sensors in...
Hiroaki Kawashima, Takashi Matsuyama
DAC
2009
ACM
14 years 10 months ago
On systematic illegal state identification for pseudo-functional testing
The discrepancy between integrated circuits' activities in normal functional mode and that in structural test mode has an increasing adverse impact on the effectiveness of ma...
Feng Yuan, Qiang Xu
DAC
2008
ACM
14 years 10 months ago
Scan chain clustering for test power reduction
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
DAC
2000
ACM
14 years 10 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
DAC
2003
ACM
14 years 10 months ago
Seed encoding with LFSRs and cellular automata
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...
Ahmad A. Al-Yamani, Edward J. McCluskey