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DAC
2007
ACM
14 years 8 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
RECSYS
2010
ACM
13 years 7 months ago
Eye-tracking product recommenders' usage
Recommender systems have emerged as an effective decision tool to help users more easily and quickly find products that they prefer, especially in e-commerce environments. However...
Sylvain Castagnos, Nicolas Jones, Pearl Pu
CHES
2007
Springer
126views Cryptology» more  CHES 2007»
14 years 1 months ago
How to Maximize the Potential of FPGA Resources for Modular Exponentiation
This paper describes a modular exponentiation processing method and circuit architecture that can exhibit the maximum performance of FPGA resources. The modular exponentiation arch...
Daisuke Suzuki
WSC
1998
13 years 8 months ago
SDI INDUSTRY: An Extend-based Tool for Continuous and High-Speed Manufacturing
Continuous or high-speed manufacturing equipment is an integral part of the food and beverage, pharmaceutical, and consumer products industries. For many years, these industries h...
Andrew J. Siprelle, Richard A. Phelps, M. Michelle...
KBS
2007
100views more  KBS 2007»
13 years 7 months ago
A retraining methodology for enhancing agent intelligence
Data mining has proven a successful gateway for discovering useful knowledge and for enhancing business intelligence in a range of application fields. Incorporating this knowledg...
Andreas L. Symeonidis, Ioannis N. Athanasiadis, Pe...