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» Using Fault Modeling in Safety Cases
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DAC
2008
ACM
14 years 10 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
FORTE
1997
13 years 11 months ago
A Framework for Distributed Object-Oriented Testing
Distributed programming and object-oriented programming are two popular programming paradigms. The former is driven by advances in networking technology whereas the latter provide...
Alan C. Y. Wong, Samuel T. Chanson, Shing-Chi Cheu...
IWMM
2011
Springer
254views Hardware» more  IWMM 2011»
13 years 20 days ago
Short-term memory for self-collecting mutators
We propose a new memory model called short-term memory for managing objects on the heap. In contrast to the traditional persistent memory model for heap management, objects in sho...
Martin Aigner, Andreas Haas, Christoph M. Kirsch, ...
IFIP12
2009
13 years 7 months ago
An Expert System Based on Parametric Net to Support Motor Pump Multi-Failure Diagnostic
Abstract Early failure detection in motor pumps is an important issue in prediction maintenance. An efficient condition-monitoring scheme is capable of providing warning and predic...
Flavia Cristina Bernardini, Ana Cristina Bicharra ...
SLP
1994
77views more  SLP 1994»
13 years 11 months ago
Modal Event Calculus
We consider a hierarchy of modal event calculi to represent and reason about partially ordered events. These calculi are based on the model of time and change of Kowalski and Sergo...
Iliano Cervesato, Luca Chittaro, Angelo Montanari