551 search results - page 27 / 111 » Using Model Checking for Reducing the Cost of Test Generatio... |
ICIS
2001
13 years 9 months ago
2001
Previous research suggests that a decline in transactions costs leads to improved economic efficiency. In this paper,weshowthatsuchadeclinewillintroduceincreasinglyuninformedconsu...
SEW
2006
IEEE
14 years 1 months ago
2006
IEEE
Pseudo-exhaustive testing uses the empirical observation that, for broad classes of software, a fault is likely triggered by only a few variables interacting. The method takes adv...
ACL
2006
13 years 9 months ago
2006
Recently proposed deterministic classifierbased parsers (Nivre and Scholz, 2004; Sagae and Lavie, 2005; Yamada and Matsumoto, 2003) offer attractive alternatives to generative sta...
DAC
1997
ACM
13 years 11 months ago
1997
ACM
We examine frequency-domain issues in the design and selection of on-chip test generators for built-in self-test (BIST) of highperformance digital filters. Test-generator/circuit...
ASPDAC
2006
ACM
13 years 11 months ago
2006
ACM
The verification of modern computing systems has grown to dominate the cost of system design, often with limited success as designs continue to be released with latent bugs. This t...