19 search results - page 2 / 4 » Using Negative Correlation to Evolve Fault-Tolerant Circuits |
129
Voted
AHS
2006
IEEE
15 years 7 months ago
2006
IEEE
A new hardware developmental model that shows strong robust transient fault-tolerant abilities and is motivated by embryonic development and a honeycomb structure is presented. Ca...
127
Voted
STOC
1997
ACM
15 years 7 months ago
1997
ACM
Shor has showed how to perform fault tolerant quantum computation when the probability for an error in a qubit or a gate, η, decays with the size of the computation polylogarithmi...
132
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DAC
2007
ACM
16 years 4 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
128
Voted
GLVLSI
2008
IEEE
15 years 10 months ago
2008
IEEE
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...
136
Voted
SEDE
2007
15 years 5 months ago
2007
— Achieving reliability in fault tolerant systems requires both avoidance and redundancy. This study focuses on avoidance as it pertains to the design of microchips. The lifecycl...