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» Using Static Analysis to Improve Automatic Test Generation
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ICCAD
1999
IEEE
84views Hardware» more  ICCAD 1999»
14 years 22 days ago
Improving coverage analysis and test generation for large designs
State space techniques have proven to be useful for measuring and improving the coverage of test vectors that are used during functional validation via simulation. By comparing th...
Jules P. Bergmann, Mark Horowitz
GECCO
2006
Springer
162views Optimization» more  GECCO 2006»
14 years 2 days ago
Improving evolutionary real-time testing
Embedded systems are often used in a safety-critical context, e.g. in airborne or vehicle systems. Typically, timing constraints must be satisfied so that real-time embedded syste...
Marouane Tlili, Stefan Wappler, Harmen Sthamer
ISSTA
2006
ACM
14 years 2 months ago
DSD-Crasher: a hybrid analysis tool for bug finding
DSD-Crasher is a bug finding tool that follows a three-step approach to program analysis: D. Capture the program’s intended execution behavior with dynamic invariant detection....
Christoph Csallner, Yannis Smaragdakis
DATE
2005
IEEE
116views Hardware» more  DATE 2005»
14 years 2 months ago
FORAY-GEN: Automatic Generation of Affine Functions for Memory Optimizations
In today’s embedded applications a significant portion of energy is spent in the memory subsystem. Several approaches have been proposed to minimize this energy, including the u...
Ilya Issenin, Nikil D. Dutt
FATES
2003
Springer
14 years 1 months ago
Mutually Enhancing Test Generation and Specification Inference
Generating effective tests and inferring likely program specifications are both difficult and costly problems. We propose an approach in which we can mutually enhance the tests and...
Tao Xie, David Notkin