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VLSID
2000
IEEE
102views VLSI» more  VLSID 2000»
14 years 3 months ago
Inductance Characterization of Small Interconnects Using Test-Signal Method
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
Jeegar Tilak Shah, Madhav P. Desai, Sugata Sanyal
TOG
2008
123views more  TOG 2008»
13 years 10 months ago
Efficient multiple scattering in hair using spherical harmonics
Previous research has shown that a global multiple scattering simulation is needed to achieve physically realistic renderings of hair, particularly light-colored hair with low abs...
Jonathan T. Moon, Bruce Walter, Steve Marschner
ICCAD
2000
IEEE
97views Hardware» more  ICCAD 2000»
14 years 3 months ago
Error Catch and Analysis for Semiconductor Memories Using March Tests
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
Chi-Feng Wu, Chih-Tsun Huang, Chih-Wea Wang, Kuo-L...
TVCG
2008
121views more  TVCG 2008»
13 years 10 months ago
Multi-Focused Geospatial Analysis Using Probes
Traditional geospatial information visualizations often present views that restrict the user to a single perspective. When zoomed out, local trends and anomalies become suppressed ...
Thomas Butkiewicz, Wenwen Dou, Zachary Wartell, Wi...
DSRT
2008
IEEE
14 years 5 months ago
Modeling System Security Rules with Time Constraints Using Timed Extended Finite State Machines
Security and reliability are of paramount importance in designing and building real-time systems because any security failure can put the public and the environment at risk. In th...
Wissam Mallouli, Amel Mammar, Ana R. Cavalli