An on-chip test-and-measurement system with digital interfaces that can perform device-level characterization of large-dense arrays of transistors is demonstrated in 90- and 65-nm...
Simeon Realov, William McLaughlin, Kenneth L. Shep...
Abstract—A dependable software system contains two important components, namely, error detection mechanisms and error recovery mechanisms. An error detection mechanism attempts t...
Abstract— In this paper we consider serially concatenated and iteratively decoded Irregular Variable Length Coding (IrVLC) combined with precoded Differential Space-Time Spreadin...
Mohammed El-Hajjar, Robert G. Maunder, Osamah Alam...
A mathematical formula containing one or more free variables is "general" in the sense that it provides a solution to an entire category of problems. For example, the fa...
John R. Koza, Jessen Yu, Martin A. Keane, William ...
We present a tutorial survey on some recent approaches to unsupervised machine learning in the context of statistical pattern recognition. In statistical PR, there are two classica...