1192 search results - page 210 / 239 » Variation-Aware Fault Modeling |
143
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ICCD
2006
IEEE
16 years 28 days ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
147
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ICCAD
2008
IEEE
16 years 28 days ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
128
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ICCAD
2006
IEEE
16 years 28 days ago
2006
IEEE
With the continued scaling of CMOS technologies and reduced design margins, the reliability concerns induced by transient faults have become prominent. Moreover, the popular energ...
133
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CODES
2009
IEEE
15 years 10 months ago
2009
IEEE
This paper presents a system-level design methodology for networked embedded systems that exploits existing data-redundancy to increase their reliability. The presented approach n...
150
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GLOBECOM
2008
IEEE
15 years 10 months ago
2008
IEEE
— The basic operation of Delay Tolerant Mobile Sensor Network (DTMSN) is for pervasive data gathering in networks with intermittent connectivity, where traditional data gathering...