226 search results - page 14 / 46 » Variation-tolerant circuits: circuit solutions and technique... |
ISQED
2011
IEEE
13 years 5 days ago
2011
IEEE
Due to the dramatic increase in design complexity, verifying the functional correctness of a circuit is becoming more difficult. Therefore, bugs may escape all verification effo...
CRYPTO
2010
Springer
13 years 9 months ago
2010
Springer
Homomorphic encryption (HE) schemes enable computing functions on encrypted data, by means of a public Eval procedure that can be applied to ciphertexts. But the evaluated ciphert...
ICCAD
2003
IEEE
14 years 5 months ago
2003
IEEE
Placement is one of the most important steps in the RTLto-GDSII synthesis process, as it directly defines the interconnects, which have become the bottleneck in circuit and syste...
ICCD
2007
IEEE
14 years 5 months ago
2007
IEEE
Scan chains are widely used to improve the testability of IC designs. In traditional 2D IC designs, various design techniques on the construction of scan chains have been proposed...
ISQED
2003
IEEE
14 years 1 months ago
2003
IEEE
In this paper an embedded IDDQ testing architecture is presented that targets to overcome the excessive hardware overhead requirements in built-in current sensing based testing ap...