1585 search results - page 45 / 317 » Variational Analysis of Pseudospectra |
TVLSI
2008
13 years 7 months ago
2008
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance o...
BMCBI
2010
13 years 7 months ago
2010
Background: Advances in sequencing and genotyping technologies are leading to the widespread availability of multi-species variation data, dense genotype data and large-scale rese...
SIGPRO
2002
13 years 7 months ago
2002
This paper describes newly invented multiscale transforms known under the name of the ridgelet [6] and the curvelet transforms [9, 8]. These systems combine ideas of multiscale an...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Within-die variation in leakage power consumption is substantial and increasing for chip-level multiprocessors (CMPs) and multiprocessor systems-on-chip. Dealing with this problem...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...