1585 search results - page 52 / 317 » Variational Analysis of Pseudospectra |
TCAD
2008
13 years 7 months ago
2008
Manufacturing process variations lead to variability in circuit delay and, if not accounted for, can cause excessive timing yield loss. The familiar traditional approaches to timin...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
VTS
2000
IEEE
14 years 7 hour ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
APBC
2003
13 years 9 months ago
2003
In this paper we suggest the requirements for an open platform designed for the description, distribution and analysis of genetic polymorphism data. This platform is discussed in ...
CVPR
2008
IEEE
14 years 9 months ago
2008
IEEE
The images of an outdoor scene collected over time are valuable in studying the scene appearance variation which can lead to novel applications and help enhance existing methods t...