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VLSI
2007
Springer
14 years 3 months ago
Parametric structure-preserving model order reduction
Abstract—Analysis and verification environments for nextgeneration nano-scale RFIC designs must be able to cope with increasing design complexity and to account for new effects,...
Jorge Fernandez Villena, Wil H. A. Schilders, L. M...
VTS
2000
IEEE
114views Hardware» more  VTS 2000»
14 years 1 months ago
Detection of CMOS Defects under Variable Processing Conditions
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
Amy Germida, James F. Plusquellic
ICIP
2010
IEEE
13 years 6 months ago
Affine-invariant modeling of shape-appearance images applied on sign language handshape classification
We propose a novel affine-invariant modeling of hand shapeappearance images, which offers a compact and descriptive representation of the hand configurations. Our approach combine...
Anastasios Roussos, Stavros Theodorakis, Vassilis ...
ICRA
2007
IEEE
119views Robotics» more  ICRA 2007»
14 years 3 months ago
Progressive Clamping
—In this paper we propose the progressive clamping method to better model the kinematic anisotropy of joint limits for virtual mannequins or robots. Like recent approaches our me...
Daniel Raunhardt, Ronan Boulic
ISQED
2002
IEEE
129views Hardware» more  ISQED 2002»
14 years 1 months ago
Design Method and Automation of Comparator Generation for Flash A/D Converter
The design methods and the automation of the comparator circuit layout generation for a flash A/D converter are presented in this paper. The threshold inverter quantization (TIQ)...
Daegyu Lee, Jincheol Yoo, Kyusun Choi