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DATE
2000
IEEE
132views Hardware» more  DATE 2000»
14 years 7 days ago
Automatic Test Bench Generation for Validation of RT-Level Descriptions: An Industrial Experience
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
DAC
2002
ACM
14 years 8 months ago
Software-based diagnosis for processors
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed test of high-speed microprocessors using low-cost testers. We explore the fault diagnos...
Li Chen, Sujit Dey
ISLPED
2006
ACM
100views Hardware» more  ISLPED 2006»
14 years 1 months ago
Selective writeback: exploiting transient values for energy-efficiency and performance
Today’s superscalar microprocessors use large, heavily-ported physical register files (RFs) to increase the instruction throughput. The high complexity and power dissipation of ...
Deniz Balkan, Joseph J. Sharkey, Dmitry Ponomarev,...
MTV
2005
IEEE
138views Hardware» more  MTV 2005»
14 years 1 months ago
Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
Paolo Bernardi, Ernesto Sánchez, Massimilia...
DAC
2007
ACM
14 years 8 months ago
Chip Multi-Processor Generator
The drive for low-power, high performance computation coupled with the extremely high design costs for ASIC designs, has driven a number of designers to try to create a flexible, ...
Alex Solomatnikov, Amin Firoozshahian, Wajahat Qad...