1093 search results - page 10 / 219 » Verifying VLSI Circuits |
ICEC
1994
13 years 8 months ago
1994
A parallel implementation of a genetic algorithm used to evolve simple analog VLSI circuits is described. The parallel computer system consisted of twenty distributed SPARC workst...
GLVLSI
2007
IEEE
13 years 11 months ago
2007
IEEE
This paper describes a formal verification methodology of highnthesis (HLS) process. The abstraction level of the input to HLS is so high compared to that of the output that the v...
DAC
2002
ACM
14 years 8 months ago
2002
ACM
Reducing power dissipation is one of the most principle subjects in VLSI design today. Scaling causes subthreshold leakage currents to become a large component of total power diss...
DFT
2004
IEEE
13 years 11 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
SBCCI
2005
ACM
14 years 1 months ago
2005
ACM
Temperature sensors and voltage references require cells that generate both PTAT (Proportional To Absolute Temperature) and NTC (Negative Temperature Coefficient) voltages. We pre...