1093 search results - page 122 / 219 » Verifying VLSI Circuits |
GECCO
2003
Springer
14 years 2 months ago
2003
Springer
Continuous Time Recurrent Neural Networks (CTRNNs) have previously been proposed as an enabling paradigm for evolving analog electrical circuits to serve as controllers for physica...
GLVLSI
2010
IEEE
14 years 2 months ago
2010
IEEE
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
GLVLSI
2010
IEEE
14 years 2 months ago
2010
IEEE
This paper investigates read-out schemes for a crossbar memory using CNTFET-based elements as cross-points. Two read-out schemes are presented in this paper; the first scheme bias...
DFT
2002
IEEE
14 years 1 months ago
2002
IEEE
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...
VLSID
2002
IEEE
14 years 1 months ago
2002
IEEE
Power supply noise is a strong function of the switching activities of the circuit modules. Peak power supply noise can be significantly reduced by judiciously arranging the modu...