1093 search results - page 158 / 219 » Verifying VLSI Circuits |
ISPD
2004
ACM
14 years 2 months ago
2004
ACM
Due to increasing design complexity, routing congestion has become a critical problem in VLSI designs. This paper introduces a distributed metric to predict routing congestion for...
DFT
2003
IEEE
14 years 2 months ago
2003
IEEE
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
DFT
2003
IEEE
14 years 2 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
IPPS
2003
IEEE
14 years 2 months ago
2003
IEEE
In this paper, we discuss a parallel tabu search algorithm with implementation in a heterogeneous environment. Two parallelization strategies are integrated: functional decomposit...
ISVLSI
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper describes a technique for re-ordering of scan cells to minimize power dissipation that is also capable of reducing the area overhead of the circuit compared to a random...