Due to increasing design complexity, routing congestion has become a critical problem in VLSI designs. This paper introduces a distributed metric to predict routing congestion for...
Rupesh S. Shelar, Sachin S. Sapatnekar, Prashant S...
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
Wangqi Qiu, Xiang Lu, Zhuo Li, D. M. H. Walker, We...
In this paper, we discuss a parallel tabu search algorithm with implementation in a heterogeneous environment. Two parallelization strategies are integrated: functional decomposit...
Ahmad A. Al-Yamani, Sadiq M. Sait, Hassan Barada, ...
This paper describes a technique for re-ordering of scan cells to minimize power dissipation that is also capable of reducing the area overhead of the circuit compared to a random...