Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test v...
Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailog...
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...
After a detailed analysis and discussion of two important characteristics of today’s battery cells (i.e., their current-capacity and current-voltage curves), this paper descr...
Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the trad...
The power dissipated by system-level buses is the largest contribution to the global power of complex VLSI circuits. Therefore, the minimization of the switching activity at the I...
Luca Benini, Giovanni De Micheli, Donatella Sciuto...