1093 search results - page 159 / 219 » Verifying VLSI Circuits |
VTS
2002
IEEE
14 years 1 months ago
2002
IEEE
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test v...
VTS
2002
IEEE
14 years 1 months ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...
ASPDAC
2000
ACM
14 years 1 months ago
2000
ACM
After a detailed analysis and discussion of two important characteristics of today’s battery cells (i.e., their current-capacity and current-voltage curves), this paper descr...
DAC
2000
ACM
14 years 1 months ago
2000
ACM
Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the trad...
DATE
1998
IEEE
14 years 1 months ago
1998
IEEE
The power dissipated by system-level buses is the largest contribution to the global power of complex VLSI circuits. Therefore, the minimization of the switching activity at the I...