As CMOS technology scales deeper into the nanometer regime, factors such as leakage power and chip temperature emerge as critically important concerns for high-performance VLSI des...
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
The continuous increase of leakage power consumption
in deep sub-micro technologies necessitates more aggressive
leakage control. Runtime leakage control (RTLC) is effective,
si...
In the era of deep sub-wavelength lithography for nanometer VLSI designs, manufacturability and yield issues are critical and need to be addressed during the key physical design i...
A zero-knowledge proof allows a prover to convince a verifier of an assertion without revealing any further information beyond the fact that the assertion is true. Secure multipar...