1093 search results - page 169 / 219 » Verifying VLSI Circuits |
TVLSI
2008
13 years 8 months ago
2008
As CMOS technology scales deeper into the nanometer regime, factors such as leakage power and chip temperature emerge as critically important concerns for high-performance VLSI des...
ET
2002
13 years 8 months ago
2002
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
VLSID
2010
IEEE
13 years 2 months ago
2010
IEEE
The continuous increase of leakage power consumption
in deep sub-micro technologies necessitates more aggressive
leakage control. Runtime leakage control (RTLC) is effective,
si...
DAC
2011
ACM
12 years 8 months ago
2011
ACM
In the era of deep sub-wavelength lithography for nanometer VLSI designs, manufacturability and yield issues are critical and need to be addressed during the key physical design i...
STOC
2007
ACM
14 years 9 months ago
2007
ACM
A zero-knowledge proof allows a prover to convince a verifier of an assertion without revealing any further information beyond the fact that the assertion is true. Secure multipar...