1093 search results - page 177 / 219 » Verifying VLSI Circuits |
TVLSI
2008
13 years 8 months ago
2008
With continued scaling into the sub-90nm regime, the role of process, voltage and temperature (PVT) variations on the performance of VLSI circuits has become extremely important. T...
TODAES
2002
13 years 8 months ago
2002
ct Cross-coupled noise analysis has become a critical concern in today's VLSI designs. Typically, noise analysis makes an assumption that all aggressing nets can simultaneousl...
DAC
2003
ACM
14 years 9 months ago
2003
ACM
Sleep transistors are effective to reduce dynamic and leakage power. The cluster-based design was proposed to reduce the sleep transistor area by clustering gates to minimize the ...
ISCAS
2007
IEEE
14 years 3 months ago
2007
IEEE
- Data in conventional six transistor (6T) static random access memory (SRAM) cells are vulnerable to noise due to the direct access to the data storage nodes through the bit lines...
ISCAS
2007
IEEE
14 years 3 months ago
2007
IEEE
—Piezoelectric materials have been proposed as embedded power source, which are capable of converting mechanical energy into electrical energy. However, power generated from a pi...