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» Verifying VLSI Circuits
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ISQED
2000
IEEE
131views Hardware» more  ISQED 2000»
14 years 1 months ago
Low Power Testing of VLSI Circuits: Problems and Solutions
Power and energy consumption of digital systems may increase significantly during testing. This extra power consumption due to test application may give rise to severe hazards to ...
Patrick Girard
ISQED
2009
IEEE
133views Hardware» more  ISQED 2009»
14 years 3 months ago
A novel ACO-based pattern generation for peak power estimation in VLSI circuits
Estimation of maximal power consumption is an essential task in VLSI circuit realizations since power value significantly affects the reliability of the circuits. The key issue o...
Yi-Ling Liu, Chun-Yao Wang, Yung-Chih Chen, Ya-Hsi...
DAC
2005
ACM
13 years 10 months ago
Constraint-aware robustness insertion for optimal noise-tolerance enhancement in VLSI circuits
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
Chong Zhao, Yi Zhao, Sujit Dey
ISPD
2005
ACM
188views Hardware» more  ISPD 2005»
14 years 2 months ago
A semi-persistent clustering technique for VLSI circuit placement
Placement is a critical component of today's physical synthesis flow with tremendous impact on the final performance of VLSI designs. However, it accounts for a significant p...
Charles J. Alpert, Andrew B. Kahng, Gi-Joon Nam, S...
IPPS
2002
IEEE
14 years 1 months ago
Fast Inductance Extraction of Large VLSI Circuits
Accurate estimation of signal delay is critical to the design and verification of VLSI circuits. At very high frequencies, signal delay in circuits with small feature sizes is do...
Hemant Mahawar, Vivek Sarin, Weiping Shi